New Renishaw Optical Probe

Created specifically for small machining centers, the innovative OMP400 optical probe measures only 40 mm in diameter and 50 mm in length, combining miniaturization of the highly successful OMP40 probe with new advances in strain gauge technology. The probe's diminutive size allows small machine users for the first time to benefit from the high accuracy of strain gauge technology. The innovative probe allows operators of small machining centers to reduce set-up times, scrap and fixture costs, improve process control with high accuracy on-machine measurement, and realize "done in one" production efficiencies. The OMP400 is suitable for use on machines with short Z-axis travel and spindles as small as HSK32.

Offering an unrivaled combination of size, accuracy, reliability and robustness, the OMP400 can bring the benefits of probing to many high accuracy applications. Using Renishaw's advanced strain gauge technology, the OMP400 can achieve far greater levels of accuracy than possible from a standard mechanical probe, making it suitable for a range of applications where high precision measurement is a must.

Strain gauges allow the probe to trigger at much lower and highly consistent contact forces, resulting in less bending of the stylus and negligible pre-travel for greater accuracy. First seen on the MP700 spindle-probe, strain gauge technology is unique to Renishaw and delivers superior probe repeatability.

Reduced in size but not in robustness, the OMP400 is sealed to IPX8 and built to withstand the harshest machine tool environments, giving greater resistance to stylus overtravels and shocks caused by tool changers. Battery life provides up to 50 hours of continuous use.

The probe features Renishaw's existing transmission system and a new 'modulated' method, offering improved resistance to optical interference. This allows the OMP400 to be partnered with either existing OMM and OMI receiver, or the new OMI-2 integrated receiver and interface. It is ideal for retrofitting to existing machines, or as a simple upgrade for existing probe users.